TESTING/EIG/sstech.f(3) Library Functions Manual TESTING/EIG/sstech.f(3) NAME TESTING/EIG/sstech.f SYNOPSIS Functions/Subroutines subroutine sstech (n, a, b, eig, tol, work, info) SSTECH Function/Subroutine Documentation subroutine sstech (integer n, real, dimension( * ) a, real, dimension( * ) b, real, dimension( * ) eig, real tol, real, dimension( * ) work, integer info) SSTECH Purpose: Let T be the tridiagonal matrix with diagonal entries A(1) ,..., A(N) and offdiagonal entries B(1) ,..., B(N-1)). SSTECH checks to see if EIG(1) ,..., EIG(N) are indeed accurate eigenvalues of T. It does this by expanding each EIG(I) into an interval [SVD(I) - EPS, SVD(I) + EPS], merging overlapping intervals if any, and using Sturm sequences to count and verify whether each resulting interval has the correct number of eigenvalues (using SSTECT). Here EPS = TOL*MACHEPS*MAXEIG, where MACHEPS is the machine precision and MAXEIG is the absolute value of the largest eigenvalue. If each interval contains the correct number of eigenvalues, INFO = 0 is returned, otherwise INFO is the index of the first eigenvalue in the first bad interval. Parameters N N is INTEGER The dimension of the tridiagonal matrix T. A A is REAL array, dimension (N) The diagonal entries of the tridiagonal matrix T. B B is REAL array, dimension (N-1) The offdiagonal entries of the tridiagonal matrix T. EIG EIG is REAL array, dimension (N) The purported eigenvalues to be checked. TOL TOL is REAL Error tolerance for checking, a multiple of the machine precision. WORK WORK is REAL array, dimension (N) INFO INFO is INTEGER 0 if the eigenvalues are all correct (to within 1 +- TOL*MACHEPS*MAXEIG) >0 if the interval containing the INFO-th eigenvalue contains the incorrect number of eigenvalues. Author Univ. of Tennessee Univ. of California Berkeley Univ. of Colorado Denver NAG Ltd. Definition at line 100 of file sstech.f. Author Generated automatically by Doxygen for LAPACK from the source code. LAPACK Version 3.12.0 TESTING/EIG/sstech.f(3)