nvme-virtium-save-smart-to-vtview-log - Periodically save smart attributes into a log file (csv format).
nvme virtium save-smart-to-vtview-log <device> [--run-time=<NUM> | -r <NUM>]
[--freq=<NUM> | -f <NUM>]
[--output-file=<FILE> | -o <FILE>]
[--test-name=<NAME> | -n <NAME>]
This command automates the process of collecting SMART data periodically and saving the data in a ready-to-analyze format. Each entry is saved with timestamp and in csv format. Users can use excel to analyze the data. Some examples of use cases are collecting SMART data for temperature characterization, collecting data to calculate endurance, or collecting SMART data during a test or during normal operation.
The <device> parameter is mandatory and may be either the NVMe character device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1).
On success, the command generates a log file, which contains an entry for identify device (current features & settings) and periodic entries of SMART data.
This command runs for the time specified by the option <run-time>, and collects SMART data at the frequency specified by the option <freq>. If the output file name is not specified, this command will generate a file name that include model string and serial number of the device.
If the test-name option is specified, it will be recorded in the log file and be used as part of the log file name.
-r <NUM>, --run-time=<NUM>
-f <NUM>, --freq=<NUM>
-o <FILE>, --output-file=<FILE>
-n <NAME>, --test-name=<NAME>
# nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=0.25 --test-name=burn-in-at-(-40)
# nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=1 --test-name=Endurance-test-JEDEG-219-workload
# nvme virtium save-smart-to-vtview-log /dev/yourDevice
Part of the nvme-user suite