TESTING/EIG/dbdt02.f(3) Library Functions Manual TESTING/EIG/dbdt02.f(3)

TESTING/EIG/dbdt02.f


subroutine dbdt02 (m, n, b, ldb, c, ldc, u, ldu, work, resid)
DBDT02

DBDT02

Purpose:

!>
!> DBDT02 tests the change of basis C = U**H * B by computing the
!> residual
!>
!>    RESID = norm(B - U * C) / ( max(m,n) * norm(B) * EPS ),
!>
!> where B and C are M by N matrices, U is an M by M orthogonal matrix,
!> and EPS is the machine precision.
!> 

Parameters

M
!>          M is INTEGER
!>          The number of rows of the matrices B and C and the order of
!>          the matrix Q.
!> 

N

!>          N is INTEGER
!>          The number of columns of the matrices B and C.
!> 

B

!>          B is DOUBLE PRECISION array, dimension (LDB,N)
!>          The m by n matrix B.
!> 

LDB

!>          LDB is INTEGER
!>          The leading dimension of the array B.  LDB >= max(1,M).
!> 

C

!>          C is DOUBLE PRECISION array, dimension (LDC,N)
!>          The m by n matrix C, assumed to contain U**H * B.
!> 

LDC

!>          LDC is INTEGER
!>          The leading dimension of the array C.  LDC >= max(1,M).
!> 

U

!>          U is DOUBLE PRECISION array, dimension (LDU,M)
!>          The m by m orthogonal matrix U.
!> 

LDU

!>          LDU is INTEGER
!>          The leading dimension of the array U.  LDU >= max(1,M).
!> 

WORK

!>          WORK is DOUBLE PRECISION array, dimension (M)
!> 

RESID

!>          RESID is DOUBLE PRECISION
!>          RESID = norm(B - U * C) / ( max(m,n) * norm(B) * EPS ),
!> 

Author

Univ. of Tennessee

Univ. of California Berkeley

Univ. of Colorado Denver

NAG Ltd.

Definition at line 111 of file dbdt02.f.

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